ROSLI, N. .; CHAN, K.; A. RAHMAN, S. .; PUTRI JAMAL, I. .; ASPANUT, Z. . Structural and Optical Properties of SiOx/Au/SiOx Layer Films on the Effect of Rapid Thermal Annealing Process: Chemical Vapour Deposition. International Journal of Fundamental Physical Sciences, [S. l.], v. 1, n. 4, p. 74-77, 2011. DOI: 10.14331/ijfps.2011.330018. Disponível em: https://www.fundamentaljournals.org/index.php/ijfps/article/view/95. Acesso em: 25 jun. 2022.